Abstract
A study was performed on the effects of indium tin oxide (ITO) on Co/Pd and CoB/Pd multilayers, where the ITO was deposited at different temperatures. The magnetic properties of ITO were measured using a vibrating sample magnetometer and the transmission electron microscopy was used to measure the electron diffraction patterns and the grain sizes. It was shown that ITO grown in pure Ar both at room temperature and 230 °C, has crystalline structure.
Original language | English (US) |
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Pages (from-to) | 7849-7851 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 93 |
Issue number | 10 3 |
DOIs | |
State | Published - May 15 2003 |