Effect of Ni50P50 sub-seed layer on CoCrPtTa/CoCrTa/CrTi/NiAl thin film media for glass substrate

Eng Wei Soo; Siew It Pang; Jian Ping Wang

Effect of Ni₅₀P₅₀ sub-seed layer on CoCrPtTa/CoCrTa/CrTi/NiAl thin film media for glass substrate

Eng Wei Soo, Siew It Pang, Jian Ping Wang

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

CoCrPtTa(10 nm)/CoCrTa(2 nm)/CrTi(40 nm)/NiAl(50 nm)/Ni₅₀P₅₀ thin film media were deposited on glass substrate by dc magnetron sputtering. The magnetic properties of the thin films were determined using transmission electron microscopy (TEM) and x-ray diffractometer (XRD). Surface morphology was observed using scanning probe microscopy (SPM).

Original language	English (US)
Journal	Digests of the Intermag Conference
State	Published - Jan 1 2000

Find It

Find It at U of M Libraries

Cite this

@article{af75796c8e4e4ff1bb329f53fed00d35,

title = "Effect of Ni50P50 sub-seed layer on CoCrPtTa/CoCrTa/CrTi/NiAl thin film media for glass substrate",

abstract = "CoCrPtTa(10 nm)/CoCrTa(2 nm)/CrTi(40 nm)/NiAl(50 nm)/Ni50P50 thin film media were deposited on glass substrate by dc magnetron sputtering. The magnetic properties of the thin films were determined using transmission electron microscopy (TEM) and x-ray diffractometer (XRD). Surface morphology was observed using scanning probe microscopy (SPM).",

author = "Soo, {Eng Wei} and Pang, {Siew It} and Wang, {Jian Ping}",

year = "2000",

month = jan,

day = "1",

language = "English (US)",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Effect of Ni50P50 sub-seed layer on CoCrPtTa/CoCrTa/CrTi/NiAl thin film media for glass substrate

AU - Soo, Eng Wei

AU - Pang, Siew It

AU - Wang, Jian Ping

PY - 2000/1/1

Y1 - 2000/1/1

N2 - CoCrPtTa(10 nm)/CoCrTa(2 nm)/CrTi(40 nm)/NiAl(50 nm)/Ni50P50 thin film media were deposited on glass substrate by dc magnetron sputtering. The magnetic properties of the thin films were determined using transmission electron microscopy (TEM) and x-ray diffractometer (XRD). Surface morphology was observed using scanning probe microscopy (SPM).

AB - CoCrPtTa(10 nm)/CoCrTa(2 nm)/CrTi(40 nm)/NiAl(50 nm)/Ni50P50 thin film media were deposited on glass substrate by dc magnetron sputtering. The magnetic properties of the thin films were determined using transmission electron microscopy (TEM) and x-ray diffractometer (XRD). Surface morphology was observed using scanning probe microscopy (SPM).

UR - http://www.scopus.com/inward/record.url?scp=0033695559&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033695559&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0033695559

SN - 0074-6843

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

ER -

Effect of Ni₅₀P₅₀ sub-seed layer on CoCrPtTa/CoCrTa/CrTi/NiAl thin film media for glass substrate

Abstract

Find It

Other files and links

Fingerprint

Cite this