CoCrPtTa(10 nm)/CoCrTa(2 nm)/CrTi(40 nm)/NiAl(50 nm)/Ni50P50 thin film media were deposited on glass substrate by dc magnetron sputtering. The magnetic properties of the thin films were determined using transmission electron microscopy (TEM) and x-ray diffractometer (XRD). Surface morphology was observed using scanning probe microscopy (SPM).
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - Jan 1 2000|