Effect of Ni50P50 sub-seed layer on CoCrPtTa/CoCrTa/CrTi/NiAl thin film media for glass substrate

Eng Wei Soo, Siew It Pang, Jian Ping Wang

Research output: Contribution to journalArticle

Abstract

CoCrPtTa(10 nm)/CoCrTa(2 nm)/CrTi(40 nm)/NiAl(50 nm)/Ni50P50 thin film media were deposited on glass substrate by dc magnetron sputtering. The magnetic properties of the thin films were determined using transmission electron microscopy (TEM) and x-ray diffractometer (XRD). Surface morphology was observed using scanning probe microscopy (SPM).

Original languageEnglish (US)
JournalDigests of the Intermag Conference
StatePublished - Jan 1 2000

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