Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs

Satya Venkata Sandeep Avvaru; Keshab Parhi

doi:10.1109/ISVLSI.2019.00073

Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs

Satya Venkata Sandeep Avvaru, Keshab Parhi

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Scopus citations

Abstract

In this paper, we study multiplexer (MUX) based feed-forward (FF) physical unclonable functions (FF PUFs) with 64 stages. This paper provides the first systematic empirical analysis of the effect of FF PUF design choices on their performance by evaluating various FF PUF structures in terms of their reliability and attack resistance. To this end, the change in reliability is studied by varying the location of FF loops and varying the number of loops within the circuit. It is observed adding more loops and arbiters makes PUFs more susceptible to noise; FF PUFs with 5 intermediate arbiters can have reliability values that are as low as 81%. It is further demonstrated that a soft-response thresholding strategy can significantly increase the reliability during authentication to more than 96%. We also show that attack resistance can change as a consequence of relative positioning of the FF loops. In case of double-loop FF PUFs (one intermediate arbiter with two utputs), it is shown that appropriately choosing the input and output locations of the FF loops, the number of challenge-response pairs required to attack can be increased by 7 times and can be further increased by 15 times if two intermediate arbiters are used.

Original language	English (US)
Title of host publication	Proceedings - 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019
Publisher	IEEE Computer Society
Pages	366-371
Number of pages	6
ISBN (Electronic)	9781538670996
DOIs	https://doi.org/10.1109/ISVLSI.2019.00073
State	Published - Jul 2019
Event	18th IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019 - Miami, United States Duration: Jul 15 2019 → Jul 17 2019

Publication series

Name	Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
Volume	2019-July
ISSN (Print)	2159-3469
ISSN (Electronic)	2159-3477

Conference

Conference	18th IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019
Country/Territory	United States
City	Miami
Period	7/15/19 → 7/17/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Keywords

Attack Resistance
Feed Forward PUFs
Hardware Security
Physical Unclonable Functions
Reliability
Security
Soft Response

Publisher link

10.1109/ISVLSI.2019.00073

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Cite this

Avvaru, S. V. S., & Parhi, K. (2019). Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs. In Proceedings - 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019 (pp. 366-371). Article 8839499 (Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI; Vol. 2019-July). IEEE Computer Society. https://doi.org/10.1109/ISVLSI.2019.00073

Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs. / Avvaru, Satya Venkata Sandeep; Parhi, Keshab.
Proceedings - 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019. IEEE Computer Society, 2019. p. 366-371 8839499 (Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI; Vol. 2019-July).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Avvaru, SVS & Parhi, K 2019, Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs. in Proceedings - 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019., 8839499, Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI, vol. 2019-July, IEEE Computer Society, pp. 366-371, 18th IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019, Miami, United States, 7/15/19. https://doi.org/10.1109/ISVLSI.2019.00073

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Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs

Abstract

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Keywords

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