Effect of laser incident energy on the structural, morphological and optical properties of Cu2ZnSnS4 (CZTS) thin films

S. M. Pawar; A. V. Moholkar; I. K. Kim; S. W. Shin; J. H. Moon; J. I. Rhee; J. H. Kim

doi:10.1016/j.cap.2009.07.023

Effect of laser incident energy on the structural, morphological and optical properties of Cu₂ZnSnS₄ (CZTS) thin films

S. M. Pawar, A. V. Moholkar, I. K. Kim, S. W. Shin, J. H. Moon, J. I. Rhee, J. H. Kim

Research output: Contribution to journal › Article › peer-review

146 Scopus citations

Abstract

The polycrystalline Cu₂ZnSnS₄ (CZTS) thin films have been prepared by pulsed laser deposition (PLD) method at room temperature. The laser incident energy was varied from 1.0 at the interval of 0.5-3.0 J/cm². The effect of laser incident energy on the structural, morphological and optical properties of CZTS thin films was studied by means of X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption. The studies reveal that an improvement in the structural, morphological and optical properties of CZTS thin films with increasing laser incident energy up to 2.5 J/cm². However, when the laser incident energy was further increased to 3.0 J/cm², leads to degrade the structural, morphological and optical properties of the CZTS thin films.

Original language	English (US)
Pages (from-to)	565-569
Number of pages	5
Journal	Current Applied Physics
Volume	10
Issue number	2
DOIs	https://doi.org/10.1016/j.cap.2009.07.023
State	Published - Mar 2010
Externally published	Yes

Bibliographical note

Funding Information:
This research was supported by the National Research Foundation of Korea (NRF) through a grant provided by the Korean Ministry of Education, Science and Technology (MEST) in 2009. (K20824000005-08B1200-00510).

Keywords

CuZnSnS (CZTS) thin films
Field emission scanning electron microscopy (FE-SEM)
Optical absorption
Polycrystalline
Pulsed laser deposition (PLD)
X-ray diffraction (XRD)

Publisher link

10.1016/j.cap.2009.07.023

Find It

Find It at U of M Libraries

Cite this

@article{ad239d3248ef4a219e5e2d200c4225e5,

title = "Effect of laser incident energy on the structural, morphological and optical properties of Cu2ZnSnS4 (CZTS) thin films",

abstract = "The polycrystalline Cu2ZnSnS4 (CZTS) thin films have been prepared by pulsed laser deposition (PLD) method at room temperature. The laser incident energy was varied from 1.0 at the interval of 0.5-3.0 J/cm2. The effect of laser incident energy on the structural, morphological and optical properties of CZTS thin films was studied by means of X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption. The studies reveal that an improvement in the structural, morphological and optical properties of CZTS thin films with increasing laser incident energy up to 2.5 J/cm2. However, when the laser incident energy was further increased to 3.0 J/cm2, leads to degrade the structural, morphological and optical properties of the CZTS thin films.",

keywords = "CuZnSnS (CZTS) thin films, Field emission scanning electron microscopy (FE-SEM), Optical absorption, Polycrystalline, Pulsed laser deposition (PLD), X-ray diffraction (XRD)",

author = "Pawar, {S. M.} and Moholkar, {A. V.} and Kim, {I. K.} and Shin, {S. W.} and Moon, {J. H.} and Rhee, {J. I.} and Kim, {J. H.}",

note = "Funding Information: This research was supported by the National Research Foundation of Korea (NRF) through a grant provided by the Korean Ministry of Education, Science and Technology (MEST) in 2009. (K20824000005-08B1200-00510).",

year = "2010",

month = mar,

doi = "10.1016/j.cap.2009.07.023",

language = "English (US)",

volume = "10",

pages = "565--569",

journal = "Current Applied Physics",

issn = "1567-1739",

publisher = "Elsevier",

number = "2",

}

TY - JOUR

T1 - Effect of laser incident energy on the structural, morphological and optical properties of Cu2ZnSnS4 (CZTS) thin films

AU - Pawar, S. M.

AU - Moholkar, A. V.

AU - Kim, I. K.

AU - Shin, S. W.

AU - Moon, J. H.

AU - Rhee, J. I.

AU - Kim, J. H.

N1 - Funding Information: This research was supported by the National Research Foundation of Korea (NRF) through a grant provided by the Korean Ministry of Education, Science and Technology (MEST) in 2009. (K20824000005-08B1200-00510).

PY - 2010/3

Y1 - 2010/3

N2 - The polycrystalline Cu2ZnSnS4 (CZTS) thin films have been prepared by pulsed laser deposition (PLD) method at room temperature. The laser incident energy was varied from 1.0 at the interval of 0.5-3.0 J/cm2. The effect of laser incident energy on the structural, morphological and optical properties of CZTS thin films was studied by means of X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption. The studies reveal that an improvement in the structural, morphological and optical properties of CZTS thin films with increasing laser incident energy up to 2.5 J/cm2. However, when the laser incident energy was further increased to 3.0 J/cm2, leads to degrade the structural, morphological and optical properties of the CZTS thin films.

AB - The polycrystalline Cu2ZnSnS4 (CZTS) thin films have been prepared by pulsed laser deposition (PLD) method at room temperature. The laser incident energy was varied from 1.0 at the interval of 0.5-3.0 J/cm2. The effect of laser incident energy on the structural, morphological and optical properties of CZTS thin films was studied by means of X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption. The studies reveal that an improvement in the structural, morphological and optical properties of CZTS thin films with increasing laser incident energy up to 2.5 J/cm2. However, when the laser incident energy was further increased to 3.0 J/cm2, leads to degrade the structural, morphological and optical properties of the CZTS thin films.

KW - CuZnSnS (CZTS) thin films

KW - Field emission scanning electron microscopy (FE-SEM)

KW - Optical absorption

KW - Polycrystalline

KW - Pulsed laser deposition (PLD)

KW - X-ray diffraction (XRD)

UR - http://www.scopus.com/inward/record.url?scp=70350702682&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=70350702682&partnerID=8YFLogxK

U2 - 10.1016/j.cap.2009.07.023

DO - 10.1016/j.cap.2009.07.023

M3 - Article

AN - SCOPUS:70350702682

SN - 1567-1739

VL - 10

SP - 565

EP - 569

JO - Current Applied Physics

JF - Current Applied Physics

IS - 2

ER -