Effect of film thickness and biaxial strain on the curie temperature of EuO

A. Melville, T. Mairoser, A. Schmehl, T. Birol, T. Heeg, B. Holländer, J. Schubert, C. J. Fennie, D. G. Schlom

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The effects of film thickness and epitaxial strain on the magnetic properties of commensurate EuO thin films grown on single crystalline (001) yttria-stabilized zirconia (YSZ) and (110) LuAlO3 substrates are presented. Magnetic measurements show a reduction in the Curie temperature (TC) for EuO/YSZ films thinner than ∼10 nm. Additionally, the EuO/LuAlO3 films exhibit a systematically lower TC than the corresponding EuO/YSZ films. This further reduction in TC is attributed to the effect of biaxial tensile strain arising from lattice mismatch: 0.0% for EuO/YSZ and +1.0% for EuO/LuAlO3.

Original languageEnglish (US)
Article number062404
JournalApplied Physics Letters
Issue number6
StatePublished - Feb 11 2013

Bibliographical note

Funding Information:
The work at Cornell was supported by the AFOSR (Grant No. FA9550-10-1-0123). The work in Augsburg was supported by the DFG (Grant No. TRR 80). A.M. gratefully acknowledges support from the NSF IGERT Program (NSF Award No. DGE-0654193) and by the IMI Program of the National Science Foundation under Award No. DMR 0843934. T.B. and C.J.F. were supported by the DOE-BES # DE-SC0002334.


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