The effects of film thickness and epitaxial strain on the magnetic properties of commensurate EuO thin films grown on single crystalline (001) yttria-stabilized zirconia (YSZ) and (110) LuAlO3 substrates are presented. Magnetic measurements show a reduction in the Curie temperature (TC) for EuO/YSZ films thinner than ∼10 nm. Additionally, the EuO/LuAlO3 films exhibit a systematically lower TC than the corresponding EuO/YSZ films. This further reduction in TC is attributed to the effect of biaxial tensile strain arising from lattice mismatch: 0.0% for EuO/YSZ and +1.0% for EuO/LuAlO3.
|Original language||English (US)|
|Journal||Applied Physics Letters|
|State||Published - Feb 11 2013|
Bibliographical noteFunding Information:
The work at Cornell was supported by the AFOSR (Grant No. FA9550-10-1-0123). The work in Augsburg was supported by the DFG (Grant No. TRR 80). A.M. gratefully acknowledges support from the NSF IGERT Program (NSF Award No. DGE-0654193) and by the IMI Program of the National Science Foundation under Award No. DMR 0843934. T.B. and C.J.F. were supported by the DOE-BES # DE-SC0002334.