Effect of film thickness and biaxial strain on the curie temperature of EuO

A. Melville, T. Mairoser, A. Schmehl, T. Birol, T. Heeg, B. Holländer, J. Schubert, C. J. Fennie, D. G. Schlom

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21 Scopus citations

Abstract

The effects of film thickness and epitaxial strain on the magnetic properties of commensurate EuO thin films grown on single crystalline (001) yttria-stabilized zirconia (YSZ) and (110) LuAlO3 substrates are presented. Magnetic measurements show a reduction in the Curie temperature (TC) for EuO/YSZ films thinner than ∼10 nm. Additionally, the EuO/LuAlO3 films exhibit a systematically lower TC than the corresponding EuO/YSZ films. This further reduction in TC is attributed to the effect of biaxial tensile strain arising from lattice mismatch: 0.0% for EuO/YSZ and +1.0% for EuO/LuAlO3.

Original languageEnglish (US)
Article number062404
JournalApplied Physics Letters
Volume102
Issue number6
DOIs
StatePublished - Feb 11 2013

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