Effect of annealing in external magnetic field on the microstructure and magnetic properties of FePt films

A. S. Kamzin; F. L. Wei; B. Ma; V. Ganeev; L. D. Zaripova

doi:10.1134/S1063785012020265

Effect of annealing in external magnetic field on the microstructure and magnetic properties of FePt films

A. S. Kamzin, F. L. Wei, B. Ma, V. Ganeev, L. D. Zaripova

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

We have studied the influence of annealing in an external magnetic field on the microstructure and magnetic properties of a multilayer Si/Fe(2 nm)/Fe ₅₀Pt ₅₀(20 nm)/Pt(2 nm) structure synthesized by means of sequential RF magnetron sputtering of the components. The magnetic field was oriented perpendicular to layers of the structure. It is established that annealing in the external magnetic field leads to the formation of predominant (001) texture in the multilayer structure with L1 ₀-FePt phase. Thus, a method of obtaining multilayer structures based on FePt films required for the perpendicular magnetic recording has been developed.

Original language	English (US)
Pages (from-to)	181-184
Number of pages	4
Journal	Technical Physics Letters
Volume	38
Issue number	2
DOIs	https://doi.org/10.1134/S1063785012020265
State	Published - Feb 2012

Bibliographical note

Funding Information:
Acknowledgments. This study was supported in part by the National Science Foundation of China, grants nos. 10874060 and 60803035.

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abstract = "We have studied the influence of annealing in an external magnetic field on the microstructure and magnetic properties of a multilayer Si/Fe(2 nm)/Fe 50Pt 50(20 nm)/Pt(2 nm) structure synthesized by means of sequential RF magnetron sputtering of the components. The magnetic field was oriented perpendicular to layers of the structure. It is established that annealing in the external magnetic field leads to the formation of predominant (001) texture in the multilayer structure with L1 0-FePt phase. Thus, a method of obtaining multilayer structures based on FePt films required for the perpendicular magnetic recording has been developed.",

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note = "Funding Information: Acknowledgments. This study was supported in part by the National Science Foundation of China, grants nos. 10874060 and 60803035.",

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AU - Wei, F. L.

AU - Ma, B.

AU - Ganeev, V.

AU - Zaripova, L. D.

N1 - Funding Information: Acknowledgments. This study was supported in part by the National Science Foundation of China, grants nos. 10874060 and 60803035.

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AB - We have studied the influence of annealing in an external magnetic field on the microstructure and magnetic properties of a multilayer Si/Fe(2 nm)/Fe 50Pt 50(20 nm)/Pt(2 nm) structure synthesized by means of sequential RF magnetron sputtering of the components. The magnetic field was oriented perpendicular to layers of the structure. It is established that annealing in the external magnetic field leads to the formation of predominant (001) texture in the multilayer structure with L1 0-FePt phase. Thus, a method of obtaining multilayer structures based on FePt films required for the perpendicular magnetic recording has been developed.

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Effect of annealing in external magnetic field on the microstructure and magnetic properties of FePt films

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