TY - JOUR
T1 - Dynamic VTH scaling scheme for active leakage power reduction
AU - Kim, C. H.
AU - Roy, K.
PY - 2002
Y1 - 2002
N2 - We present a Dynamic VTH Scaling (DVTS) scheme to save the leakage power during active mode of the circuit. The power saving strategy of DVTS is similar to that of the Dynamic VDD Scaling (DVS) scheme, which adaptively changes the supply voltage depending on the current workload of the system. Instead of adjusting the supply voltage, DVTS controls the threshold voltage by means of body bias control, in order to reduce the leakage power. The power saving potential of DVTS and its impact on dynamic and leakage power when applied to future technologies are discussed. Pros and cons of the DVTS system are dealt with in detail. Finally, a feedback loop hardware for the DVTS which tracks the optimal VTH for a given clock frequency, is proposed. Simulation results show that 92% energy savings can be achieved with DVTS for 70 nm circuits.
AB - We present a Dynamic VTH Scaling (DVTS) scheme to save the leakage power during active mode of the circuit. The power saving strategy of DVTS is similar to that of the Dynamic VDD Scaling (DVS) scheme, which adaptively changes the supply voltage depending on the current workload of the system. Instead of adjusting the supply voltage, DVTS controls the threshold voltage by means of body bias control, in order to reduce the leakage power. The power saving potential of DVTS and its impact on dynamic and leakage power when applied to future technologies are discussed. Pros and cons of the DVTS system are dealt with in detail. Finally, a feedback loop hardware for the DVTS which tracks the optimal VTH for a given clock frequency, is proposed. Simulation results show that 92% energy savings can be achieved with DVTS for 70 nm circuits.
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U2 - 10.1109/DATE.2002.998265
DO - 10.1109/DATE.2002.998265
M3 - Conference article
AN - SCOPUS:84893738755
SN - 1530-1591
SP - 163
EP - 167
JO - Proceedings -Design, Automation and Test in Europe, DATE
JF - Proceedings -Design, Automation and Test in Europe, DATE
M1 - 998265
T2 - 2002 Design, Automation and Test in Europe Conference and Exhibition, DATE 2002
Y2 - 4 March 2002 through 8 March 2002
ER -