Dynamic detection of electron spin accumulation in ferromagnet-semiconductor devices by ferromagnetic resonance

Changjiang Liu, Sahil J. Patel, Timothy A. Peterson, Chad C. Geppert, Kevin D. Christie, Gordon Stecklein, Chris J. Palmstrom, Paul A. Crowell

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


A distinguishing feature of spin accumulation in ferromagnet-semiconductor devices is its precession in a magnetic field. This is the basis for detection techniques such as the Hanle effect, but these approaches become ineffective as the spin lifetime in the semiconductor decreases. For this reason, no electrical Hanle measurement has been demonstrated in GaAs at room temperature. We show here that by forcing the magnetization in the ferromagnet to precess at resonance instead of relying only on the Larmor precession of the spin accumulation in the semiconductor, an electrically generated spin accumulation can be detected up to 300K. The injection bias and temperature dependence of the measured spin signal agree with those obtained using traditional methods. We further show that this approach enables a measurement of short spin lifetimes (<100ps), a regime that is not accessible in semiconductors using traditional Hanle techniques.

Original languageEnglish (US)
Article number10296
JournalNature communications
StatePublished - Jan 18 2016

Bibliographical note

Funding Information:
This work was supported by the National Science Foundation (NSF) under DMR-1104951, C-SPIN, one of the six centres of STARnet, a SRC programme sponsored by MARCO and DARPA, the Materials Research Science and Engineering Centers (MRSEC) programme of NSF under DMR 08–19885, and the NSF NNIN programme.

Publisher Copyright:
© 2016, Nature Publishing Group. All rights reserved.

MRSEC Support

  • Partial

PubMed: MeSH publication types

  • Journal Article
  • Research Support, U.S. Gov't, Non-P.H.S.


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