Dual cycle shift data-weighted averaging technique for multi-bit sigma-delta modulators

Xiaofen Ma, Jian Xu, Xiaobo Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Data weighted averaging (DWA) is the most popular Dynamic Element Matching (DEM) technique to reduce the effects of DAC nonlinearity in multi-bit Sigma-Delta Modulators (MBSDM). However, due to the non-symmetry of the unit-elements in multi-bit DAC, in-band signal-dependent tones always appear when a low oversampling ratio (OSR) is employed in traditional DWA. Therefore, a novel DEM technique, dual cycle shift DWA(DCSDWA), is proposed to deal with the tone problem in this paper. Compared with other modified DWAtechniques, DCSDWAis a more effective one with simple implementation. Using the proposed technique in a 4th-order MBSDM with an OSR of 32, the maximum in-band tone is reduced to 6 dB when a random DAC-element mismatching error of 0.5% is assumed. In addition, it results in a better linearity of signal-to-noise distortion ratio (SNDR) versus different input signal and a wider dynamic range (DR). The simulation results prove that the proposed DCSDWA is suitable for low OSR applications (OSR≥8) with a good performance.

Original languageEnglish (US)
Title of host publication2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
Pages174-177
Number of pages4
DOIs
StatePublished - Dec 1 2009
Event2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009 - Xi'an, China
Duration: Dec 25 2009Dec 27 2009

Other

Other2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
CountryChina
CityXi'an
Period12/25/0912/27/09

Keywords

  • DAC nonlinearity
  • Dual cycle shift DWA
  • Multi-bit sigma-delta modulators

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    Ma, X., Xu, J., & Wu, X. (2009). Dual cycle shift data-weighted averaging technique for multi-bit sigma-delta modulators. In 2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009 (pp. 174-177). [5394163] https://doi.org/10.1109/EDSSC.2009.5394163