DNA immobilization on GaP(100) investigated by kelvin probe force microscopy

David N. Richards, Dmitry Y. Zemlyanov, Rafay M. Asrar, Yena Y. Chokshi, Emily M. Cook, Thomas J. Hinton, Xinran Lu, Viet Q. Nguyen, Neil K. Patel, Jonathan R. Usher, Sriram Vaidyanathan, David A. Yeung, Albena Ivanisevic

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Abstract

Understanding changes in the properties of semiconductor materials after immobilization of biomolecules on the surface is essential for the fabrication of well-tuned and programmable devices. The work examines changes in the properties of gallium phosphide (GaP) after modification with an organic linker, a single stranded DNA, and its complementary strand. We investigated changes in surface potential with Kelvin probe force microscopy (KPFM). Analysis revealed that a more ordered adlayer of ssDNA was present when a lower concentration of linker molecule was used. KPFM data combined with coverage data obtained from X-ray photoelectron spectroscopy (XPS) further confirmed this result. Successful hybridization with the complementary strand was confirmed by both KPFM and Raman spectroscopy. The results indicate that one can control the amount of DNA on the surface by changing the initial concentration of the organic linker, and thus modulate the surface potential of the semiconductor material.

Original languageEnglish (US)
Pages (from-to)15486-15490
Number of pages5
JournalJournal of Physical Chemistry C
Volume114
Issue number36
DOIs
StatePublished - Sep 16 2010

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    Richards, D. N., Zemlyanov, D. Y., Asrar, R. M., Chokshi, Y. Y., Cook, E. M., Hinton, T. J., Lu, X., Nguyen, V. Q., Patel, N. K., Usher, J. R., Vaidyanathan, S., Yeung, D. A., & Ivanisevic, A. (2010). DNA immobilization on GaP(100) investigated by kelvin probe force microscopy. Journal of Physical Chemistry C, 114(36), 15486-15490. https://doi.org/10.1021/jp105927t