Abstract
Ptosis of the eyelids is a common condition with a myriad of causes. Its management depends on the underlying cause, which can be challenging to diagnose in some cases. Current diagnosis methods include serum antibodies, tensilon test, and electromyography (EMG). Each has its own set of limitations such as invasiveness and lack of sensitivity. To overcome these limitations, we have developed a Portable Realtime Infrared Lids, Iris and Blink (PRILIB) monitoring system, with a long-term goal to improve clinical diagnosis of ptosis. In this paper, we present the algorithms to detect and analyze eye parameters and report experimental results. From experiments conducted on normal volunteers and myasthenic patients, we found 1. Partial blinks happen when Ocular Myasthenia Gravis (OMG) patients are tired or engaged in an activity; 2. Blink rate is significantly higher for OMG patients due to failure to blink fully; 3. There are noticeably more fluctuations of palpebral aperture of OMG patients due to rising and falling of the eyelid height. These experimental findings suggest new diagnostic features for OMG patients and have implications for disease management.
Original language | English (US) |
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Title of host publication | 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1460-1464 |
Number of pages | 5 |
ISBN (Electronic) | 9781424479290 |
DOIs | |
State | Published - Nov 2 2014 |
Event | 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 - Chicago, United States Duration: Aug 26 2014 → Aug 30 2014 |
Publication series
Name | 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 |
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Other
Other | 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 |
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Country/Territory | United States |
City | Chicago |
Period | 8/26/14 → 8/30/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.