Development of energy consumption ratio test

Xiaoyun Sun, L. Kinney, B. Vinnakota

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Dynamic Idd test methods have been shown to detect defects that escape other test techniques. Normal process variations decrease the fault coverage and affect the performance of dynamic Idd test techniques. A dynamic-current based test metric, Energy Consumption Ratio (ECR), has been proposed to address the process variation problem and has been validated through extensive simulations and applications on manufactured circuits. In this paper, we first discuss the problems in practical implementation of ECR tests on large-size circuits of advanced technology, e.g., increased circuit size and leakage current degrade ECR performance. We then propose two possible solutions: one is based on extensive statistical data analysis and another uses an enhanced scan design to partition the circuit. Experimental results from simulations and actual devices are included in this paper.

Original languageEnglish (US)
Title of host publicationProceedings - 21st IEEE VLSI Test Symposium, VTS 2003
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)0769519245
StatePublished - Jan 1 2003
Event21st IEEE VLSI Test Symposium, VTS 2003 - Napa Valley, United States
Duration: Apr 27 2003May 1 2003

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Other21st IEEE VLSI Test Symposium, VTS 2003
Country/TerritoryUnited States
CityNapa Valley


  • Energy consumption
  • Testing
  • Very large scale integration


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