Determining the thickness of atomically thin MoS2 and WS2 in the TEM

Ryan J. Wu, Michael L. Odlyzko, K. Andre Mkhoyan

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)1796-1797
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

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