Determining the thickness of atomically thin MoS2 and WS2 in the TEM

Ryan J. Wu; Michael L. Odlyzko; K. Andre Mkhoyan

doi:10.1017/S143192761401071X

Determining the thickness of atomically thin MoS₂ and WS₂ in the TEM

Ryan J. Wu, Michael L. Odlyzko, K. Andre Mkhoyan

Chemical Engineering and Materials Science

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English (US)
Pages (from-to)	1796-1797
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S143192761401071X
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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10.1017/S143192761401071X

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title = "Determining the thickness of atomically thin MoS2 and WS2 in the TEM",

author = "Wu, {Ryan J.} and Odlyzko, {Michael L.} and {Andre Mkhoyan}, K.",

year = "2014",

month = aug,

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journal = "Microscopy and Microanalysis",

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note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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AU - Odlyzko, Michael L.

AU - Andre Mkhoyan, K.

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DO - 10.1017/S143192761401071X

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SN - 1431-9276

VL - 20

SP - 1796

EP - 1797

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Determining the thickness of atomically thin MoS2 and WS2 in the TEM

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Determining the thickness of atomically thin MoS₂ and WS₂ in the TEM