TY - JOUR
T1 - Determining the AC susceptibility of thin metal films using the anisotropic magnetoresistance
AU - Booth, Kevin
AU - Gray, Isaiah
AU - Dan Dahlberg, E.
N1 - Funding Information:
This work was supported by NSF GRANT DMR 1609782.
Publisher Copyright:
© 2020
PY - 2021/4/1
Y1 - 2021/4/1
N2 - The differential ac magnetic susceptibility of thin magnetic films was determined using the anisotropic magnetoresistance (AMR) to measure the response of the magnetization to an applied AC magnetic field. The differential AMR was measured with a small AC magnetic field (1 Oe) at frequencies from 5 Hz to 5000 Hz as a function of the magnitude of an applied DC field that was varied from −60 Oe to +60 Oe. A model relating the magnitude of the differential AMR to the differential AC susceptibility was developed. The ferromagnetic films investigated were permalloy, cobalt, nickel, and nickel with an antiferromagnetic nickel oxide layer on one surface. For all the samples investigated, the differential susceptibility magnitude was a function of the DC field magnitude and was frequency dependent, decreasing with increasing frequency.
AB - The differential ac magnetic susceptibility of thin magnetic films was determined using the anisotropic magnetoresistance (AMR) to measure the response of the magnetization to an applied AC magnetic field. The differential AMR was measured with a small AC magnetic field (1 Oe) at frequencies from 5 Hz to 5000 Hz as a function of the magnitude of an applied DC field that was varied from −60 Oe to +60 Oe. A model relating the magnitude of the differential AMR to the differential AC susceptibility was developed. The ferromagnetic films investigated were permalloy, cobalt, nickel, and nickel with an antiferromagnetic nickel oxide layer on one surface. For all the samples investigated, the differential susceptibility magnitude was a function of the DC field magnitude and was frequency dependent, decreasing with increasing frequency.
KW - Anisotropic magnetoresistance
KW - Magnetic susceptibility
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=85097761518&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85097761518&partnerID=8YFLogxK
U2 - 10.1016/j.jmmm.2020.167631
DO - 10.1016/j.jmmm.2020.167631
M3 - Article
AN - SCOPUS:85097761518
SN - 0304-8853
VL - 523
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
M1 - 167631
ER -