Skip to main navigation Skip to search Skip to main content

Determination of GaAsSb/GaAs heterojunction band offset by photoluminescence spectroscopy

  • J. B. Wang
  • , S. R. Johnson
  • , S. A. Chaparro
  • , D. Ding
  • , Y. Cao
  • , Yu G. Sadofyev
  • , Y. H. Zhang
  • , J. A. Gupta
  • , C. Z. Guo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Photoluminescence spectroscopy was observed for a set of Al0.5Ga0.5As/AlxGa1-xAs/GaAs0.643Sb0.357/Alx Ga1-xAs/Al0.5Ga0.5As 5-layer quantum wells with different Al mole fraction x (different conduction band barrier heights Ex= Ec(AlxGa1-xAs) - Ec(GaAs)). The theoretical calculation and the data fitting for the experimental data show the conduction band offset of GaAs0.643Sb0.357/GaAs heterojunction is almost flat (weak type I), ΔEc = Ec(GaAs) - Ec(GaAsSb) = 13 ± 13 meV and the bandgap bowing parameter for strained GaAsSb is -1.58 ± 0.01 eV.

Original languageEnglish (US)
Title of host publication2003 30th International Symposium on Compound Semiconductors, ISCS 2003
Subtitle of host publicationPost-Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages66-71
Number of pages6
ISBN (Electronic)0780386140
DOIs
StatePublished - 2003
Externally publishedYes
Event30th International Symposium on Compound Semiconductors, ISCS 2003 - San Diego, United States
Duration: Aug 25 2003Aug 27 2003

Publication series

NameIEEE International Symposium on Compound Semiconductors, Proceedings
Volume2003-August

Conference

Conference30th International Symposium on Compound Semiconductors, ISCS 2003
Country/TerritoryUnited States
CitySan Diego
Period8/25/038/27/03

Bibliographical note

Publisher Copyright:
© 2004 IEEE.

Fingerprint

Dive into the research topics of 'Determination of GaAsSb/GaAs heterojunction band offset by photoluminescence spectroscopy'. Together they form a unique fingerprint.

Cite this