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Dive into the research topics of 'Detection and repair of radiation induced single event upsets in an FPGA-based readout for TES bolometer arrays'. Together they form a unique fingerprint.- Sort by
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Graeme Smecher, François Aubin, Oleg Djazovski, Matt Dobbs, Gordon Faulkner, Fabio Gulino, Peter O. Hyland, Kevin MacDermid, Neil Rowlands
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution