Abstract
The fabrication of metal-insulator-metal junctions with insulating barriers of solid Xe was described. The flux of Xe hitting the surface was estimated from the presence of the Xe gas. The junctions produced were either shorted or exhibited low conductances. It was found that the fabrication of junctions with solid inert gas solid insulating barriers enabled to conduct tunneling spectroscopy of complex compounds that were susceptible to chemical and mechanical damage.
Original language | English (US) |
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Pages (from-to) | 4029-4031 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 19 |
DOIs | |
State | Published - Nov 10 2003 |