Abstract
We report the demonstration of high-performance top-gated metal-oxide-semiconductor field-effect transistors (MOSFETs) based on the ultra-wide bandgap perovskite oxide SrSnO3 (SSO). Using hybrid molecular beam epitaxy-grown SSO channels and ALD-deposited HfO2 gate dielectrics, the devices exhibit field-effect mobility exceeding 65 cm2/V·s , an on-state current up to 194, mA/mm, an on/off current ratio above 1×108 , and a contact resistance of 1.3 Ω·mm. The devices also show a near-ideal subthreshold slope of 68 mV/dec and negligible hysteresis, indicating a high-quality dielectric/semiconductor interface. These results establish SrSnO3 as a promising ultra-wide bandgap oxide semiconductor platform for high-performance power electronic applications.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1133-1136 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 47 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 1 2026 |
Bibliographical note
Publisher Copyright:© 1980-2012 IEEE.
Keywords
- MOSFET
- SrSnO
- perovskites
- power device
- stannate
- ulta-wide bandgap semiconductors
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