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Demonstration of High-Performance Ultra-Wide Bandgap SrSnO3 Top-Gated MOSFETs

  • Junghyun Koo
  • , Weideng Sun
  • , Donghwan Kim
  • , Hongseung Lee
  • , Chengyu Zhu
  • , Kiyoung Lee
  • , Hagyoul Bae
  • , Bharat Jalan
  • , Gang Qiu

Research output: Contribution to journalArticlepeer-review

Abstract

We report the demonstration of high-performance top-gated metal-oxide-semiconductor field-effect transistors (MOSFETs) based on the ultra-wide bandgap perovskite oxide SrSnO3 (SSO). Using hybrid molecular beam epitaxy-grown SSO channels and ALD-deposited HfO2 gate dielectrics, the devices exhibit field-effect mobility exceeding 65 cm2/V·s , an on-state current up to 194, mA/mm, an on/off current ratio above 1×108 , and a contact resistance of 1.3 Ω·mm. The devices also show a near-ideal subthreshold slope of 68 mV/dec and negligible hysteresis, indicating a high-quality dielectric/semiconductor interface. These results establish SrSnO3 as a promising ultra-wide bandgap oxide semiconductor platform for high-performance power electronic applications.

Original languageEnglish (US)
Pages (from-to)1133-1136
Number of pages4
JournalIEEE Electron Device Letters
Volume47
Issue number6
DOIs
StatePublished - Jun 1 2026

Bibliographical note

Publisher Copyright:
© 1980-2012 IEEE.

Keywords

  • MOSFET
  • SrSnO
  • perovskites
  • power device
  • stannate
  • ulta-wide bandgap semiconductors

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