Deformation twinning mechanisms from bimetal interfaces as revealed by in situ straining in the TEM

S. J. Zheng, I. J. Beyerlein, J. Wang, J. S. Carpenter, W. Z. Han, N. A. Mara

Research output: Contribution to journalArticlepeer-review

70 Scopus citations

Abstract

During in situ transmission electron microscopy indentation of layered Cu/Nb composites fabricated by accumulative roll bonding, we observed the nucleation and growth of deformation twinning in Cu. Combining dislocation theory and interface defect structure analysis, we propose that the processes of nucleation and thickening of deformation twins proceed as follows: (1) nucleation and emission of a nanometer thick twin nucleus due to the dissociation of interfacial misfit dislocations or the interaction between a run in Nb slip dislocation and the interface or both; (2) emission of a second twin nucleus by the same mechanism, but at some distance along the interface from the first; (3) in the region in-between them, twin thickening occurs by relatively rapid emission of oppositely signed twinning dislocations in order to reduce the backstresses due to the twins in processes 1 and 2; and finally (4) the continuation of this "alternating emission" growth mechanism such that eventually the entire domain in-between the two initially separated fine twin nuclei transforms into a thick twin.

Original languageEnglish (US)
Pages (from-to)5858-5866
Number of pages9
JournalActa Materialia
Volume60
Issue number16
DOIs
StatePublished - Sep 2012
Externally publishedYes

Bibliographical note

Funding Information:
The authors thank Drs. R.M. Dickerson, R.F. Zhang, K.W. Kang and N. Li for useful discussion and for experimental support. This work is supported by the Los Alamos National Laboratory Directed Research and Development (LDRD) project DR20110029.

Keywords

  • Cu-Nb
  • Deformation twinning
  • In situ TEM
  • Interface
  • Nanolamellar composites

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