Defect structures at thin film-substrate interfaces

Jinfu Hu, P. H. Leo

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We consider the loss of lattice coherence at a planar interface between a thin film and substrate. Coherence is determined locally at the interface by a relative deformation gradient at the interface. We construct an interfacial free energy density fαs such that a fully coherent interface is a global minimizer of fαs, and there are symmetry related local minima of fαs corresponding to line defects at the interface. By considering both the interfacial energy and the elastic energy of the film, we calculate equilibrium states as a function of film thickness to predict both the loss of coherence and the geometric pattern of interfacial detects.

Original languageEnglish (US)
Pages (from-to)637-665
Number of pages29
JournalJournal of the Mechanics and Physics of Solids
Volume45
Issue number5
DOIs
StatePublished - May 1997

Keywords

  • A. interfaces
  • A. phase transformations
  • B. layered materials
  • C. variational calculus

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