Defect structures at thin film-substrate interfaces

Jinfu Hu, Perry H Leo

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We consider the loss of lattice coherence at a planar interface between a thin film and substrate. Coherence is determined locally at the interface by a relative deformation gradient at the interface. We construct an interfacial free energy density fαs such that a fully coherent interface is a global minimizer of fαs, and there are symmetry related local minima of fαs corresponding to line defects at the interface. By considering both the interfacial energy and the elastic energy of the film, we calculate equilibrium states as a function of film thickness to predict both the loss of coherence and the geometric pattern of interfacial detects.

Original languageEnglish (US)
Pages (from-to)637-665
Number of pages29
JournalJournal of the Mechanics and Physics of Solids
Volume45
Issue number5
DOIs
StatePublished - Jan 1 1997

Fingerprint

Defect structures
Thin films
defects
Substrates
thin films
Interfacial energy
Free energy
Film thickness
interfacial energy
Defects
film thickness
flux density
free energy
gradients
symmetry
energy

Keywords

  • A. interfaces
  • A. phase transformations
  • B. layered materials
  • C. variational calculus

Cite this

Defect structures at thin film-substrate interfaces. / Hu, Jinfu; Leo, Perry H.

In: Journal of the Mechanics and Physics of Solids, Vol. 45, No. 5, 01.01.1997, p. 637-665.

Research output: Contribution to journalArticle

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