Deduction of the temperature-dependent structure of the four-layer intermediate smectic phase using resonant X-ray scattering

P. D. Brimicombe, N. W. Roberts, S. Jaradat, C. Southern, S. T. Wang, C. C. Huang, E. Dimasi, R. Pindak, H. F. Gleeson

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

A binary mixture of an antiferroelectric liquid-crystal material containing a selenium atom and a highly chiral dopant is investigated using resonant X-ray scattering. This mixture exhibits a remarkably wide four-layer intermediate smectic phase, the structure of which is investigated over a temperature range of 16K. Analysis of the resonant X-ray scattering data allows accurate measurement of both the helicoidal pitch and the distortion angle as a function of temperature. The former decreases rapidly as the SmC * phase is approached, whilst the latter remains constant over the temperature range studied at 8 °±3 ° . We also observe that the senses of the helicoidal pitch and the unit cell of the repeating four-layer structure are opposite in this mixture and that there is no pitch inversion over the temperature range studied.

Original languageEnglish (US)
Pages (from-to)281-287
Number of pages7
JournalEuropean Physical Journal E
Volume23
Issue number3
DOIs
StatePublished - Aug 2007

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