Skip to main navigation Skip to search Skip to main content

Data-Driven Estimation of the False Positive Rate of the Bayes Binary Classifier via Soft Labels

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Classification is a fundamental task in many applications on which data-driven methods have shown outstanding performances. However, it is challenging to determine whether such methods have achieved the optimal performance. This is mainly because the best achievable performance is typically unknown and hence, effectively estimating it is of prime importance. In this paper, we consider binary classification problems and we propose an estimator for the false positive rate (FPR) of the Bayes classifier, that is, the optimal classifier with respect to accuracy, from a given dataset. Our method utilizes soft labels, or real-valued labels, which are gaining significant traction thanks to their properties. We thoroughly examine various theoretical properties of our estimator, including its consistency, unbiasedness, rate of convergence, and variance. To enhance the versatility of our estimator beyond soft labels, we also consider noisy labels, which encompass binary labels. For noisy labels, we develop effective FPR estimators by leveraging a denoising technique and the Nadaraya-Watson estimator. Due to the symmetry of the problem, our results can be readily applied to estimate the false negative rate of the Bayes classifier.

Original languageEnglish (US)
Title of host publication2024 IEEE International Symposium on Information Theory, ISIT 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages368-373
Number of pages6
ISBN (Electronic)9798350382846
DOIs
StatePublished - 2024
Event2024 IEEE International Symposium on Information Theory, ISIT 2024 - Athens, Greece
Duration: Jul 7 2024Jul 12 2024

Publication series

NameIEEE International Symposium on Information Theory - Proceedings
ISSN (Electronic)2157-8117

Conference

Conference2024 IEEE International Symposium on Information Theory, ISIT 2024
Country/TerritoryGreece
CityAthens
Period7/7/247/12/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Fingerprint

Dive into the research topics of 'Data-Driven Estimation of the False Positive Rate of the Bayes Binary Classifier via Soft Labels'. Together they form a unique fingerprint.

Cite this