Current calculation

Gracieli Posser; Palkesh Jain; Vivek Mishra; Ricardo Reis; Sachin S Sapatnekar

doi:10.1007/978-3-319-48899-8_4

Current calculation

Gracieli Posser, Palkesh Jain, Vivek Mishra, Ricardo Reis, Sachin S Sapatnekar

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

This chapter presents how the average and RMS current values are calculated to model the EM effects in this work. The current modeling has also the contribution of two other authors: Vivek Mishra (from University of Minnesota) and Palkesh Jain (from Qualcomm India).

Original language	English (US)
Title of host publication	Electromigration Inside Logic Cells
Subtitle of host publication	Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Publisher	Springer International Publishing
Pages	45-58
Number of pages	14
ISBN (Electronic)	9783319488998
ISBN (Print)	9783319488981
DOIs	https://doi.org/10.1007/978-3-319-48899-8_4
State	Published - Jan 1 2016

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author = "Gracieli Posser and Palkesh Jain and Vivek Mishra and Ricardo Reis and Sapatnekar, {Sachin S}",

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AU - Posser, Gracieli

AU - Jain, Palkesh

AU - Mishra, Vivek

AU - Reis, Ricardo

AU - Sapatnekar, Sachin S

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Y1 - 2016/1/1

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Current calculation

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