This chapter presents how the average and RMS current values are calculated to model the EM effects in this work. The current modeling has also the contribution of two other authors: Vivek Mishra (from University of Minnesota) and Palkesh Jain (from Qualcomm India).
|Original language||English (US)|
|Title of host publication||Electromigration Inside Logic Cells|
|Subtitle of host publication||Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS|
|Publisher||Springer International Publishing|
|Number of pages||14|
|State||Published - Jan 1 2016|