Current calculation

Gracieli Posser, Palkesh Jain, Vivek Mishra, Ricardo Reis, Sachin S Sapatnekar

Research output: Chapter in Book/Report/Conference proceedingChapter


This chapter presents how the average and RMS current values are calculated to model the EM effects in this work. The current modeling has also the contribution of two other authors: Vivek Mishra (from University of Minnesota) and Palkesh Jain (from Qualcomm India).

Original languageEnglish (US)
Title of host publicationElectromigration Inside Logic Cells
Subtitle of host publicationModeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
PublisherSpringer International Publishing
Number of pages14
ISBN (Electronic)9783319488998
ISBN (Print)9783319488981
StatePublished - Jan 1 2016

Bibliographical note

Publisher Copyright:
© Springer International Publishing AG 2017.


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