CRYOGENIC BEHAVIOR OF SCALED CMOS DEVICES.

Keyphrases

• CMOS Devices 100%
• Scaled CMOS 100%
• Channel Length 66%
• Velocity Saturation 66%
• Liquid Nitrogen Temperature 66%
• Propagation Delay 66%
• Low Temperature 33%
• Performance Enhancement 33%
• Supply Voltage 33%
• Analytical Model 33%
• Switching Speed 33%
• Low-field Mobility 33%
• Saturation Effect 33%
• Saturation Velocity 33%
• Device Switching 33%
• Delay Chain 33%

Engineering

• Channel Length 100%
• Cmos Device 100%
• Propagation Delay 100%
• Low-Temperature 50%
• Switching Speed 50%
• Saturation Effect 50%
• Operation Temperature 50%
• Supply Voltage 50%
• Analytical Model 50%