TY - JOUR
T1 - Correlating Polymer Viscoelastic Properties with Friction Measures by Scanning Probe Microscopy
AU - Hammerschmidt, Jon A.
AU - Haugstad, Greg
AU - Moasser, Bahram
AU - Jones, Richard R.
AU - Gladfelter, Wayne L.
PY - 1998/1/1
Y1 - 1998/1/1
N2 - Scanning probe microscopy (SPM) was used to image as well as quantitatively characterize the viscoelastic character of polymer films through the use of frictional force measurements. Measurements on several polymer systems, which vary in morphology, structure, and hydrophilicity, displayed an increase in friction at specific scan velocities. The velocity dependence on friction is attributed to molecular relaxations occurring within the polymer surface caused by energy imparted, over the contact area, by the probe tip. Determination of the frequency of imparted energy suggested a correlation between bulk viscoelastic relaxations, measured by traditional dynamic mechanical and dielectric techniques, and friction measured by SPM. The ability to further image this frictional dissipation, on the tens of nanometers scale, is also demonstrated.
AB - Scanning probe microscopy (SPM) was used to image as well as quantitatively characterize the viscoelastic character of polymer films through the use of frictional force measurements. Measurements on several polymer systems, which vary in morphology, structure, and hydrophilicity, displayed an increase in friction at specific scan velocities. The velocity dependence on friction is attributed to molecular relaxations occurring within the polymer surface caused by energy imparted, over the contact area, by the probe tip. Determination of the frequency of imparted energy suggested a correlation between bulk viscoelastic relaxations, measured by traditional dynamic mechanical and dielectric techniques, and friction measured by SPM. The ability to further image this frictional dissipation, on the tens of nanometers scale, is also demonstrated.
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U2 - 10.1021/bk-1998-0694.ch017
DO - 10.1021/bk-1998-0694.ch017
M3 - Article
AN - SCOPUS:0347174918
SN - 0097-6156
VL - 694
SP - 288
EP - 297
JO - ACS Symposium Series
JF - ACS Symposium Series
ER -