Correction: Thin films and bulk phases conucleate at the interfaces of pentacene thin films (The Journal of Physical Chemistry C (2021) 125:30 (16803-16809) DOI: 10.1021/acs.jpcc.1c04432)

This correction enumerates the following changes to the original publication: 1. An additional author (Greg Haugstad) is added to the original author list. 2. The description of the Atomic Force Microscopy section of the Experimental Section should read as follows: ATOMIC FORCE MICROSCOPY (AFM) A Keysight 5500 scanning probe microscope was operated in contact mode using a model 9524B 90 × 90 × 8 μm scanner. The latter was freshly Z-recalibrated 3-4 days prior to this work (both Z scanner and Z sensor) using a model TGZ03 511 nm-step calibration grating from MikroMasch. The instrument was operated in closed loop X-Y. Z sensor images were processed to obtain all height information reported. A cantilever/tip (type FORT from Applied Nanostructures) was used for all images reported. Surface tracking was actuated at ∼10-20 nN of the applied load. Height images were subsequently leveled by subtracting a fitted plane function. Z sensor measurements on subregions on film and bare substrate (two terraces) were processed into two-peak height histograms. Mean and standard deviation film thickness measurements were produced from this analysis as demonstrated in the Supporting Information. 3. The Acknowledgment should read as corrected here.