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Cool-CIM: Cryogenic Operation of Analog Compute-In-Memory for Improved Power-efficiency

  • Wei Chun Wang
  • , Rakshith Saligram
  • , Sudarshan Sharma
  • , Minah Lee
  • , Amol Gaidhane
  • , Yu Cao
  • , Arijit Raychowdhury
  • , Suman Datta
  • , Saibal Mukhopadhyay

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Analog computing-in-memory (ACIM) is a promising technology that performs computation on the bitlines to alleviate memory bottleneck, but the power consumption of peripheral circuits limits its power efficiency (TOPS/Watt). This work shows that a cryogenically cooled ACIM (Cool-CIM) can leverage improved device characteristics, such as higher ION/IOFF ratio, and higher transconductance, to lower the operating voltage and power of peripheral circuits. Circuit simulations with empirically calibrated models of 14nm FinFET at cryogenic temperature show 54% reduction in EDP and 80% increase in TOPS/W for voltage optimized cryogenic ACIM compared to 300K operation. The study establishes the feasibility of in-sensor processing of analog signals in cryogenic infrared sensors.

Original languageEnglish (US)
Title of host publication2023 International Electron Devices Meeting, IEDM 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350327670
DOIs
StatePublished - 2023
Externally publishedYes
Event2023 International Electron Devices Meeting, IEDM 2023 - San Francisco, United States
Duration: Dec 9 2023 → Dec 13 2023

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)0163-1918

Conference

Conference2023 International Electron Devices Meeting, IEDM 2023
Country/TerritoryUnited States
CitySan Francisco
Period12/9/23 → 12/13/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

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