Abstract
Analog computing-in-memory (ACIM) is a promising technology that performs computation on the bitlines to alleviate memory bottleneck, but the power consumption of peripheral circuits limits its power efficiency (TOPS/Watt). This work shows that a cryogenically cooled ACIM (Cool-CIM) can leverage improved device characteristics, such as higher ION/IOFF ratio, and higher transconductance, to lower the operating voltage and power of peripheral circuits. Circuit simulations with empirically calibrated models of 14nm FinFET at cryogenic temperature show 54% reduction in EDP and 80% increase in TOPS/W for voltage optimized cryogenic ACIM compared to 300K operation. The study establishes the feasibility of in-sensor processing of analog signals in cryogenic infrared sensors.
| Original language | English (US) |
|---|---|
| Title of host publication | 2023 International Electron Devices Meeting, IEDM 2023 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9798350327670 |
| DOIs | |
| State | Published - 2023 |
| Externally published | Yes |
| Event | 2023 International Electron Devices Meeting, IEDM 2023 - San Francisco, United States Duration: Dec 9 2023 → Dec 13 2023 |
Publication series
| Name | Technical Digest - International Electron Devices Meeting, IEDM |
|---|---|
| ISSN (Print) | 0163-1918 |
Conference
| Conference | 2023 International Electron Devices Meeting, IEDM 2023 |
|---|---|
| Country/Territory | United States |
| City | San Francisco |
| Period | 12/9/23 → 12/13/23 |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
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