Control and systems approaches to atomic force microscopy

Pranav Agarwal, Murti V. Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems approaches to AFM. This paper also delineates the impact controls and systems perspectives have on AFM related research and indicates future directions.

Original languageEnglish (US)
Title of host publicationProceedings of the 17th World Congress, International Federation of Automatic Control, IFAC
Edition1 PART 1
DOIs
StatePublished - Dec 1 2008
Event17th World Congress, International Federation of Automatic Control, IFAC - Seoul, Korea, Republic of
Duration: Jul 6 2008Jul 11 2008

Publication series

NameIFAC Proceedings Volumes (IFAC-PapersOnline)
Number1 PART 1
Volume17
ISSN (Print)1474-6670

Other

Other17th World Congress, International Federation of Automatic Control, IFAC
CountryKorea, Republic of
CitySeoul
Period7/6/087/11/08

Keywords

  • Identification and control methods
  • Microsystems: nano- and micro-technologies

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    Agarwal, P., & Salapaka, M. V. (2008). Control and systems approaches to atomic force microscopy. In Proceedings of the 17th World Congress, International Federation of Automatic Control, IFAC (1 PART 1 ed.). (IFAC Proceedings Volumes (IFAC-PapersOnline); Vol. 17, No. 1 PART 1). https://doi.org/10.3182/20080706-5-KR-1001.3717