Abstract
The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems approaches to AFM. This paper also delineates the impact controls and systems perspectives have on AFM related research and indicates future directions.
Original language | English (US) |
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Title of host publication | Proceedings of the 17th World Congress, International Federation of Automatic Control, IFAC |
Edition | 1 PART 1 |
DOIs | |
State | Published - 2008 |
Event | 17th World Congress, International Federation of Automatic Control, IFAC - Seoul, Korea, Republic of Duration: Jul 6 2008 → Jul 11 2008 |
Publication series
Name | IFAC Proceedings Volumes (IFAC-PapersOnline) |
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Number | 1 PART 1 |
Volume | 17 |
ISSN (Print) | 1474-6670 |
Other
Other | 17th World Congress, International Federation of Automatic Control, IFAC |
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Country/Territory | Korea, Republic of |
City | Seoul |
Period | 7/6/08 → 7/11/08 |
Bibliographical note
Funding Information:This work was supported in part by the National Science Foundation by the ECS and CMS divisions
Keywords
- Identification and control methods
- Microsystems: nano- and micro-technologies