Abstract
The design of active array structures in analog circuits requires careful matching to minimize the impact of variations. This work presents a constructive approach for building these arrays to directly incorporate shifts due to process variations, considering systematic first-order and second order gradients; to account for systematic layout effects, including parasitic mismatch and layout-dependent effects due to stress; and to ensure that the resulting layout delivers high performance. The proposed algorithms are targeted to FinFET technologies and are validated for multiple analog blocks in a commercial 12nm FinFET process. The layouts generated by the proposed method are demonstrated to provide better matching and performance than prior methods.
Original language | English (US) |
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Pages (from-to) | 1 |
Number of pages | 1 |
Journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
DOIs | |
State | Accepted/In press - 2024 |
Bibliographical note
Publisher Copyright:IEEE
Keywords
- Analog circuits
- electromigration
- FinFETs
- Layout
- layout-dependent effects
- mismatch
- nonlinear gradients
- Routing
- routing parasitic
- Systematics
- Transistors
- Wires