Confidence scalable post-silicon statistical delay prediction under process variations

Keyphrases

• Process Variation 100%
• Statistical Delay 100%
• Delay Prediction 100%
• Post-silicon 100%
• Integrated Circuits 50%
• Parameter Variation 50%
• Benchmark Suite 50%
• On-chip Test 50%
• Statistical Timing Analysis 50%
• Circuit Analysis 50%
• Pre-silicon 50%
• Increased Variability 50%

Computer Science

• Timing Analysis 100%
• Process Variation 100%
• Parameter Variation 100%
• Experimental Result 100%
• Integrated Circuit 100%

Material Science

• Silicon 100%
• Electronic Circuit 66%