Conducting probe atomic force microscopy: A characterization tool for molecular electronics

Tommie W. Kelley; Eric L. Granstrom; C. Daniel Frisbie

doi:10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B

Conducting probe atomic force microscopy: A characterization tool for molecular electronics

Tommie W. Kelley
, Eric L. Granstrom
, C. Daniel Frisbie

Chemical Engineering and Materials Science

Research output: Contribution to journal › Article › peer-review

217 Scopus citations

Original language	English (US)
Pages (from-to)	261-264
Number of pages	4
Journal	Advanced Materials
Volume	11
Issue number	3
DOIs	https://doi.org/10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B
State	Published - 1999

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10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B

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@article{dfda19532ba645e0aab36c5251317fb3,

title = "Conducting probe atomic force microscopy: A characterization tool for molecular electronics",

author = "Kelley, \{Tommie W.\} and Granstrom, \{Eric L.\} and \{Daniel Frisbie\}, C.",

year = "1999",

doi = "10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B",

language = "English (US)",

volume = "11",

pages = "261--264",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley-Blackwell",

number = "3",

}

TY - JOUR

T1 - Conducting probe atomic force microscopy

T2 - A characterization tool for molecular electronics

AU - Kelley, Tommie W.

AU - Granstrom, Eric L.

AU - Daniel Frisbie, C.

PY - 1999

Y1 - 1999

UR - https://www.scopus.com/pages/publications/0033077793

UR - https://www.scopus.com/pages/publications/0033077793#tab=citedBy

U2 - 10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B

DO - 10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B

M3 - Article

AN - SCOPUS:0033077793

SN - 0935-9648

VL - 11

SP - 261

EP - 264

JO - Advanced Materials

JF - Advanced Materials

IS - 3

ER -

Conducting probe atomic force microscopy: A characterization tool for molecular electronics

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