Conducting polymer material characterization using high frequency planar transmission line measurement

Young Seek Cho, Rhonda R. Franklin

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

A conducting polymer, poly 3-hexylthiophene (P3HT) is characterized with the metal-insulator-semiconductor (MIS) measurement method and the high frequency planar circuit method From the MIS measurement method, the relative dielectric constant of the P3HT film is estimated to be 4.4 For the high frequency planar circuit method, a coplanar waveguide is fabricated on the P3HT film When applying +20 V to the CPW on P3HT film, the P3HT film is in accumulation mode and becomes lossy The CPW on P3HT film is 1.5 dB lossier than the CPW on SiO2 film without P3HT film at 50 GHz

Original languageEnglish (US)
Pages (from-to)237-240
Number of pages4
JournalTransactions on Electrical and Electronic Materials
Volume13
Issue number5
DOIs
StatePublished - 2012

Keywords

  • CPW
  • Conducting polymer
  • MOS capacitor
  • P3HT
  • Planar transmission line

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