Comparison of surface layer properties of composite resins by ESCA, SEM and X-ray cliffractometry

M. Okazaki, W. H. Douglas

Research output: Contribution to journalArticle

13 Scopus citations

Abstract

Hyperfine surface layer properties of three types of dental composite resins, highly-filled, conventional, and micro-filled resins, were studied using X-ray photoelectron spectroscopy (ESCA) by a combination of X-ray diffractometry and scanning electron microscopy (SEM). X-ray diffraction and SEM analysis showed clearly that each resin has different characteristics of SiO2 particle size and distribution. ESCA depth resolution with argon ion etching indicated that in contrast to conventional and microfilled resins, carbon due to polymers of highly-filled resin decreases dramatically with increasing depth in the nanometer range of the resin-rich surface layer.

Original languageEnglish (US)
Pages (from-to)284-288
Number of pages5
JournalBiomaterials
Volume5
Issue number5
DOIs
StatePublished - Sep 1984

Keywords

  • ESCA
  • composites
  • nanometer range
  • resin-rich surface layer

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