Current trends in integrated circuit processing project gate insulators with oxide equivalent thicknesses of 1.5 to 1.0 nm. Gate oxides in this thickness range have oxide capacitances of 1 to 5 μF/cm2. When oxide capacitances are this large, traditional high-frequency capacitance-voltage techniques for measuring interface states can be inaccurate. We show that a combination of high and low frequency capacitance-voltage data, along with frequency dependent conductance methods, produce more accurate results.
|Original language||English (US)|
|Journal||Materials Research Society Symposium - Proceedings|
|State||Published - Jan 1 2001|
|Event||Gate Stack and Silicide Issues in Silicon Processing II - San Francisco, CA, United States|
Duration: Apr 17 2001 → Apr 19 2001