COMPARISON OF ALTERNATIVE SELF CHECK TECHNIQUES IN SEMICONDUCTOR MEMORIES.

L. A. Jack, Larry L Kinney, R. O. Berg

Research output: Contribution to conferencePaper

1 Scopus citations

Abstract

A discussion is presented of the tradeoff criteria which must be considered for a reliable memory design including: (1) reliability criteria, (2) fault coverage criteria, and (3) implementation criteria, and provides sample tradeoff data which will allow the designer to evaluate these alternatives.

Original languageEnglish (US)
Pages170-174
Number of pages5
StatePublished - Jan 1 1977
EventDig Pap IEEE Comput Soc Int Conf 14th - San Francisco, CA, USA
Duration: Feb 28 1977Mar 3 1977

Other

OtherDig Pap IEEE Comput Soc Int Conf 14th
CitySan Francisco, CA, USA
Period2/28/773/3/77

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    Jack, L. A., Kinney, L. L., & Berg, R. O. (1977). COMPARISON OF ALTERNATIVE SELF CHECK TECHNIQUES IN SEMICONDUCTOR MEMORIES.. 170-174. Paper presented at Dig Pap IEEE Comput Soc Int Conf 14th, San Francisco, CA, USA, .