Common-centroid (CC) layouts are widely used in analog design to make circuits resilient to variations by matching device characteristics. However, CC layout may involve increased routing complexity and higher parasitics than other alternative layout schemes. This paper critically analyzes the fundamental assumptions behind the use of common-centroid layouts, incorporating considerations related to systematic and random variations as well as the performance impact of common-centroid layout. Based on this study, conclusions are drawn on when CC layout styles can reduce variation, improve performance (even if they do not reduce variation), and when non-CC layouts are preferable.
|Original language||English (US)|
|Title of host publication||Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||6|
|State||Published - Feb 1 2021|
|Event||2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021 - Virtual, Online|
Duration: Feb 1 2021 → Feb 5 2021
|Name||2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)|
|Conference||2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021|
|Period||2/1/21 → 2/5/21|
Bibliographical noteFunding Information:
This work is supported in part by the DARPA IDEA program, as part of the ALIGN project, under SPAWAR Contract N660011824048.
© 2021 EDAA.