Abstract
This paper presents an overview of common-centroid (CC) layout styles, used in analog designs to overcome the impact of systematic variations. CC layouts must be carefully engineered to minimize the impact of mismatch. Algorithms for CC layout must be aware of routing parasitics, layout-dependent effects (for active devices), and the performance impact of layout choices. The optimal CC layout further depends on factors such as the choice of the unit device and the relative impact of uncorrelated and systematic variations. The paper also examines scenarios where non-CC layouts may be preferable to CC layouts.
Original language | English (US) |
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Title of host publication | ASP-DAC 2022 - 27th Asia and South Pacific Design Automation Conference, Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 114-121 |
Number of pages | 8 |
ISBN (Electronic) | 9781665421355 |
DOIs | |
State | Published - 2022 |
Event | 27th Asia and South Pacific Design Automation Conference, ASP-DAC 2022 - Virtual, Online, Taiwan, Province of China Duration: Jan 17 2022 → Jan 20 2022 |
Publication series
Name | Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC |
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Volume | 2022-January |
Conference
Conference | 27th Asia and South Pacific Design Automation Conference, ASP-DAC 2022 |
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Country/Territory | Taiwan, Province of China |
City | Virtual, Online |
Period | 1/17/22 → 1/20/22 |
Bibliographical note
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