Combining dictionary coding and LFSR reseeding for test data compression

Xiaoyun Sun, Larry Kinney, Bapiraju Vinnakota

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improve the compression efficiency for test data compression. We also present a fast matrix calculation method which significantly reduces the computation time to find a solution for partial LFSR reseeding. Experimental results on ISCAS89 benchmark circuits show that our approach is better than either dictionary coding or LFSR reseeding, and outperforms several test data compression methods proposed recently.

Original languageEnglish (US)
Pages (from-to)944-947
Number of pages4
JournalProceedings - Design Automation Conference
StatePublished - Sep 20 2004

Keywords

  • Built-In Self Test
  • VLSI test

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