Abstract
In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improve the compression efficiency for test data compression. We also present a fast matrix calculation method which significantly reduces the computation time to find a solution for partial LFSR reseeding. Experimental results on ISCAS89 benchmark circuits show that our approach is better than either dictionary coding or LFSR reseeding, and outperforms several test data compression methods proposed recently.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 944-947 |
| Number of pages | 4 |
| Journal | Proceedings - Design Automation Conference |
| DOIs | |
| State | Published - 2004 |
| Event | Proceedings of the 41st Design Automation Conference - San Diego, CA, United States Duration: Jun 7 2004 → Jun 11 2004 |
Keywords
- Built-In Self Test
- VLSI test