Circuit models for constant impedance micromachined lines on dielectric transitions

S. Riki Banerjee, Rhonda Franklin Drayton

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

Constant impedance microstrip lines printed across nonuniform thickness substrates are studied. Accurate LC models are described to predict the discontinuity effect for dielectric step changes greater than 200 μm at the boundary interface. A variety of step or taper transition combinations in the conductor and dielectric are considered. When compared to full-wave simulations, the successfully modeled designs have return and insertion losses within 3 and 0.33 dB, respectively.

Original languageEnglish (US)
Pages (from-to)105-111
Number of pages7
JournalIEEE Transactions on Microwave Theory and Techniques
Volume52
Issue number1 I
DOIs
StatePublished - Jan 2004

Keywords

  • Dielectric discontinuities
  • Micromachining
  • Microstrip
  • Substrate discontinuities

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