Circuit design for reliability

Ricardo Reis; Gilson Wirth; Yu Cao

doi:10.1007/978-1-4614-4078-9

Circuit design for reliability

Ricardo Reis
, Gilson Wirth
, Yu Cao

Research output: Book/Report › Book

34 Scopus citations

Abstract

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Original language	English (US)
Publisher	Springer New York
Number of pages	272
ISBN (Electronic)	9781461440789
ISBN (Print)	9781461440772
DOIs	https://doi.org/10.1007/978-1-4614-4078-9
State	Published - Jan 1 2015
Externally published	Yes

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Publisher Copyright:
© Springer Science+Business Media New York 2015.

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10.1007/978-1-4614-4078-9

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AB - This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

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Circuit design for reliability

Abstract

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