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"charge leakage" at LaMnO3/SrTiO3 interfaces

  • Javier Garcia-Barriocanal
  • , Flavio Y. Bruno
  • , Alberto Rivera-Calzada
  • , Zouhair Sefrioui
  • , Norbert M. Nemes
  • , Mar Garcia-Hernández
  • , Juan Rubio-Zuazo
  • , German R. Castro
  • , Maria Varela
  • , Stephen J. Pennycook
  • , Carlos Leon
  • , Jacobo Santamaria

Research output: Contribution to journal › Article › peer-review

Abstract

Direct evidence for charge leakage at the interface of epitaxial SrTiO 3/LaMnO3 superlattices with atomically sharp interfaces is provided. The direction of charge leakage can be reversed by changing the LMO/STO thickness ratio. This result will be important for the understanding of some of the reported limitations of oxide devices involving manganite/titanate interfaces.

Original languageEnglish (US)
Pages (from-to)627-632
Number of pages6
JournalAdvanced Materials
Volume22
Issue number5
DOIs
StatePublished - Feb 2 2010

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