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Characterizing the Impact of RTN on Logic and SRAM Operation Using a Dual Ring Oscillator Array Circuit
Qianying Tang,
Chris H. Kim
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
9
Scopus citations
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Dive into the research topics of 'Characterizing the Impact of RTN on Logic and SRAM Operation Using a Dual Ring Oscillator Array Circuit'. Together they form a unique fingerprint.
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Engineering
Networks (Circuits)
100%
Supply Voltage
66%
Frequency Shift
66%
Induced Noise
66%
Performance
33%
Measurer
33%
High Precision
33%
Main Idea
33%
Sampling Time
33%
Temperature Condition
33%
Operating Frequency
33%
Measurement Resolution
33%
Delay Circuits
33%
Test Structure
33%
Stress Condition
33%
Detection Technique
33%
Metal Gate
33%
Noise Margin
33%
Earth and Planetary Sciences
Impact
100%
Array
100%
Microprocessor
50%
Condition
50%
Margin
50%
Electric Potential
50%
Frequency Shift
50%
Time
25%
Datum
25%
Metal
25%
Precision
25%
Sampling
25%
Temperature
25%
Monitor
25%
Dating
25%
Beat Frequency
25%
Trap
25%
Delay Circuit
25%
Frequency Measurement
25%