Characterizing the Impact of RTN on Logic and SRAM Operation Using a Dual Ring Oscillator Array Circuit

Engineering

• Networks (Circuits) 100%
• Supply Voltage 66%
• Frequency Shift 66%
• Induced Noise 66%
• Performance 33%
• Measurer 33%
• High Precision 33%
• Main Idea 33%
• Sampling Time 33%
• Temperature Condition 33%
• Operating Frequency 33%
• Measurement Resolution 33%
• Delay Circuits 33%
• Test Structure 33%
• Stress Condition 33%
• Detection Technique 33%
• Metal Gate 33%
• Noise Margin 33%

Earth and Planetary Sciences

• Impact 100%
• Array 100%
• Microprocessor 50%
• Condition 50%
• Margin 50%
• Electric Potential 50%
• Frequency Shift 50%
• Time 25%
• Datum 25%
• Metal 25%
• Precision 25%
• Sampling 25%
• Temperature 25%
• Monitor 25%
• Dating 25%
• Beat Frequency 25%
• Trap 25%
• Delay Circuit 25%
• Frequency Measurement 25%