Characterization of the three-dimensional structure of paper using x-ray microtomography

Amit Goel, Manolis Tzanakakis, Shuiyuan Huang, Shri Ramaswamy, Doeung Choi, Bandaru V. Ramarao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

X-ray microtomography was used to obtain three-dimensional bulk images of commercial liquid packaging board samples in a non-destructive manner. Porosity and specific surface area of the samples were then calculated using image analysis. Porosity values obtained by image analysis were compared with the values obtained by caliper-basis weight measurement and mercury intrusion porosimetry. Interestingly the x-ray images indicate that even though the pores follow a highly tortuous path they all seem to be interconnected.

Original languageEnglish (US)
Title of host publicationTAPPI Engineering Conference
Pages407-411
Number of pages5
StatePublished - Dec 1 2000
EventProceedings of the 2000 TAPPI Engineering Conference - Atlanta, GA, United States
Duration: Sep 17 2000Sep 21 2000

Publication series

NameTAPPI Engineering Conference

Other

OtherProceedings of the 2000 TAPPI Engineering Conference
CountryUnited States
CityAtlanta, GA
Period9/17/009/21/00

Fingerprint Dive into the research topics of 'Characterization of the three-dimensional structure of paper using x-ray microtomography'. Together they form a unique fingerprint.

  • Cite this

    Goel, A., Tzanakakis, M., Huang, S., Ramaswamy, S., Choi, D., & Ramarao, B. V. (2000). Characterization of the three-dimensional structure of paper using x-ray microtomography. In TAPPI Engineering Conference (pp. 407-411). (TAPPI Engineering Conference).