CHARACTERIZATION OF CMOS LATCH-UP.

C. C. Huang; M. D. Hartranft; N. F. Pu; C. Yue; C. Rahn; J. Schrankler; G. D. Kirchner; F. L. Hampton; T. E. Hendrickson

doi:10.1109/iedm.1982.190323

CHARACTERIZATION OF CMOS LATCH-UP.

C. C. Huang, M. D. Hartranft, N. F. Pu, C. Yue, C. Rahn, J. Schrankler, G. D. Kirchner, F. L. Hampton, T. E. Hendrickson

Technology Commercialization

Research output: Contribution to journal › Conference article › peer-review

15 Scopus citations

Original language	English (US)
Pages (from-to)	454-457
Number of pages	4
Journal	Unknown Journal
DOIs	https://doi.org/10.1109/iedm.1982.190323
State	Published - 1982

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10.1109/iedm.1982.190323

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@article{62ad73eae2f047db85d63064d4ed859e,

title = "CHARACTERIZATION OF CMOS LATCH-UP.",

author = "Huang, {C. C.} and Hartranft, {M. D.} and Pu, {N. F.} and C. Yue and C. Rahn and J. Schrankler and Kirchner, {G. D.} and Hampton, {F. L.} and Hendrickson, {T. E.}",

year = "1982",

doi = "10.1109/iedm.1982.190323",

language = "English (US)",

pages = "454--457",

journal = "Unknown Journal",

issn = "0022-1120",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - CHARACTERIZATION OF CMOS LATCH-UP.

AU - Huang, C. C.

AU - Hartranft, M. D.

AU - Pu, N. F.

AU - Yue, C.

AU - Rahn, C.

AU - Schrankler, J.

AU - Kirchner, G. D.

AU - Hampton, F. L.

AU - Hendrickson, T. E.

PY - 1982

Y1 - 1982

UR - http://www.scopus.com/inward/record.url?scp=0020247835&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020247835&partnerID=8YFLogxK

U2 - 10.1109/iedm.1982.190323

DO - 10.1109/iedm.1982.190323

M3 - Conference article

AN - SCOPUS:0020247835

SN - 0022-1120

SP - 454

EP - 457

JO - Unknown Journal

JF - Unknown Journal

ER -

CHARACTERIZATION OF CMOS LATCH-UP.

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