Cascadable in-memory computing based on symmetric writing and readout

  • Lizheng Wang
  • , Junlin Xiong
  • , Bin Cheng
  • , Yudi Dai
  • , Fuyi Wang
  • , Chen Pan
  • , Tianjun Cao
  • , Xiaowei Liu
  • , Pengfei Wang
  • , Moyu Chen
  • , Shengnan Yan
  • , Zenglin Liu
  • , Jingjing Xiao
  • , Xianghan Xu
  • , Zhenlin Wang
  • , Youguo Shi
  • , Sang Wook Cheong
  • , Haijun Zhang
  • , Shi Jun Liang
  • , Feng Miao

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

The building block of in-memory computing with spintronic devices is mainly based on the magnetic tunnel junction with perpendicular interfacial anisotropy (p-MTJ). The resulting asymmetric write and readout operations impose challenges in downscaling and direct cascadability of p-MTJ devices. Here, we propose that a previously unimplemented symmetric write and readout mechanism can be realized in perpendicular-anisotropy spin-orbit (PASO) quantum materials based on Fe3GeTe2 and WTe2. We demonstrate that field-free and deterministic reversal of the perpendicular magnetization can be achieved using unconventional charge–to–z-spin conversion. The resulting magnetic state can be readily probed with its intrinsic inverse process, i.e., z-spin–to–charge conversion. Using the PASO quantum material as a fundamental building block, we implement the functionally complete set of logic-in-memory operations and a more complex nonvolatile half-adder logic function. Our work highlights the potential of PASO quantum materials for the development of scalable energy-efficient and ultrafast spintronic computing.

Original languageEnglish (US)
Article numbereabq6833
JournalScience Advances
Volume8
Issue number49
DOIs
StatePublished - Dec 7 2022
Externally publishedYes

Bibliographical note

Publisher Copyright:
Copyright © 2022 The Authors, some rights reserved;

Fingerprint

Dive into the research topics of 'Cascadable in-memory computing based on symmetric writing and readout'. Together they form a unique fingerprint.

Cite this