Capturing post-silicon variations using a representative critical path

Keyphrases

• Adaptation 50%
• Adaptation Techniques 50%
• Circuit Delay 50%
• Circuit Design 50%
• Critical Path Replica 100%
• Guard Band 100%
• Nanoscale Technology 50%
• Novel Algorithm 50%
• Post-silicon 100%
• Prediction Error 50%
• Process Variation 50%
• Replica Method 100%
• Worst-case Delay 50%

Computer Science

• Critical Path 100%
• Experimental Result 10%
• Prediction Error 10%
• Process Variation 10%