Cadmium zinc telluride substrates were grown by the vertical and horizontal Bridgman techniques, characterized, and evaluated. Evaluation included the fabrication and testing of infrared focal plane arrays. Correlations of substrate defects and FPA performance were made.
|Original language||English (US)|
|Number of pages||6|
|Journal||Journal of Electronic Materials|
|State||Published - Jan 1 1999|
|Event||Proceedings of the 1998 U.S. Workshop on the Physics and Chmeistry of II-VI Materials - Charleston, SC, USA|
Duration: Oct 20 1998 → Oct 22 1998