Cadmium zinc telluride substrate growth, characterization, and evaluation

M. Kestigian, A. B. Bollong, J. J. Derby, H. L. Glass, K. Harris, L. Hettich, P. K. Liao, P. Mitra, P. W. Norton, H. Wadley

Research output: Contribution to journalConference articlepeer-review

14 Scopus citations


Cadmium zinc telluride substrates were grown by the vertical and horizontal Bridgman techniques, characterized, and evaluated. Evaluation included the fabrication and testing of infrared focal plane arrays. Correlations of substrate defects and FPA performance were made.

Original languageEnglish (US)
Pages (from-to)726-731
Number of pages6
JournalJournal of Electronic Materials
Issue number6
StatePublished - Jan 1 1999
Externally publishedYes
EventProceedings of the 1998 U.S. Workshop on the Physics and Chmeistry of II-VI Materials - Charleston, SC, USA
Duration: Oct 20 1998Oct 22 1998

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