Abstract
The saturation of VOc at larger band gaps in Cu(In, Ga)Se2 devices presents a major challenge in developing high efficiency solar devices for tandem solar applications. Although recent studies have shown that recombination at the buffer/absorber interface dominates in high Ga samples with wide band gaps, the interface parameters are not well understood to accurately model the device behavior. In this work we have applied temperature dependent CV and DLCP methods to estimate the interface state density along the bandgap in CIGS and CIAGS based solar devices. We have also used DLTS to study the nature of deep levels in CIGS and CIAGS devices. Based on our analysis and device simulation results, we attribute the VOC saturation in wide gap CIAGS devices to increased recombination rate at the interface.
Original language | English (US) |
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Title of host publication | 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 2263-2268 |
Number of pages | 6 |
ISBN (Electronic) | 9781509027248 |
DOIs | |
State | Published - Nov 18 2016 |
Event | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: Jun 5 2016 → Jun 10 2016 |
Publication series
Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
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Volume | 2016-November |
ISSN (Print) | 0160-8371 |
Other
Other | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 |
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Country/Territory | United States |
City | Portland |
Period | 6/5/16 → 6/10/16 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
Keywords
- CIAGS
- CIGS
- DLCP
- DLTS
- Electrical Characterization
- SCAPS modeling
- Wide band-gap solar cells