BTI-induced aging under random stress waveforms: Modeling, simulation and silicon validation

Keyphrases

• Model Validation 100%
• Dynamic Voltage Scaling 100%
• Silicon Validation 100%
• Reaction-diffusion 100%
• Ping 100%
• Simulation Validation 100%
• Stress Pattern 100%
• Random Stress 100%
• Induced Aging 100%
• Waveform Modeling 100%
• Model Simulation 100%
• Stress Voltage 100%
• Aging 50%
• Simula 50%
• Circuit Level 50%
• Constant Stress 50%
• Stress Conditions 50%
• Tion 50%
• Aging Analysis 50%
• Mixed-signal Design 50%
• Device Level 50%
• Degradation Rate 50%
• Recovery Phase 50%
• Aging Simulation 50%
• Comprehensive Solution 50%
• Stress Phase 50%
• Detrapping 50%
• Age Prediction 50%
• Compact Modeling 50%
• Detrapping Mechanism 50%
• Proposed Work 50%

Engineering

• Voltage Scaling 100%
• Illustrates 50%
• Simplifies 50%
• Constant Stress 50%
• Stress Condition 50%
• Degradation Rate 50%