Biaxiality and temperature dependence of 3- and 4-layer intermediate smectic-phase structures as revealed by resonant X-ray scattering
- N. W. Roberts
- , S. Jaradat
- , L. S. Hirst
- , M. S. Thurlow
- , Y. Wang
- , S. T. Wang
- , Z. Q. Liu
- , C. C. Huang
- , J. Bai
- , R. Pindak
- , H. F. Gleeson
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